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TSSI's TD-Scan for National Instruments has an easy-to-use graphical user interface to translate WGL and STIL scan patterns into NI native format.

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To view a webcast detailing how the new TSSI TD-Scan for NI Integrates with NI PXI instrumentation, click on image or here.

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Powerful Waveform Viewer enables quick viewing and editing of timing and pattern from imported WGL and STIL scan files. All transaction details can be quickly viewed by hovering cursor over the edge. Users can analyze timing and state transactions quickly when zooming through the waveform regions.

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Signal Table enables familiar spreadsheet format for pin mapping and a wide variety of operations on signals such as: synthetic signal derivation, setting of levels, ATE specific pin modes, pin groups, and import/export.

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TD-Scan for National Instruments

• Reads WGL and STIL scan patterns
• Facilitates high-speed ATE programming for National Instrument’s NI 65XX High Speed Digital I/O Series
• Flexible test-pattern generation options
• Powerful waveform viewer and intuitive graphical interface for interactive editing
• GUI or Batch Operation
• Seamless scalability up to TD-Sim, TestDeveloper, and the unix-based TDS package
• Works with National Instrument’s LabVIEW graphical system design environment

TD-Scan for National Instruments and LabVIEW

TD-Scan for National Instruments is a result of the collaboration between TSSI and National Instruments (NI)
to enable semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems.

TD-Scan for National Instruments produces LabVIEW data so that engineers can read and manipulate WGL and STIL vectors in LabVIEW graphical system design software and the NI Digital Waveform Editor, both of
which provide control for all NI digital test hardware.

Key Capabilities:

• Waveform data generation and Instrument setup based on simulation output (WGL or STIL) file.
• Adjustable Sample Clock Rate to optimize waveform accuracy vs channel memory
• Automatic checks for maximum clock rate and edge delays across slots
• Automatic device channel assignment and customizable system board layout based on customer configuration
• Supported NI Instruments:

• PXI/PCI-6541/6542
• PXI/PCI-6544/6545
• PXI/PCI-6547/6548
• PXI/PCI-6551/6552
• PXI/PCI-6561/6562

Save Time with Intermediate Database

TD-Scan for National Instruments processes WGL and STIL files by first converting them into an intermediate
database. Any subsequent data analysis and adjustment can be done directly to the database using the waveform viewer. Then, when ready, a TesterBridge for NI can be invoked to generate LabVIEW-ready data. For large patterns, this will save many conversion hours.

TD-Scan for National Instruments is also designed for users with multiple ATE platforms. Its modular
architecture is ready for additional “Bridge” module or TesterBridge, to be activated simply via license
keys. The intermediate database, again, saves time when targeting multiple platforms is required, validation to
product retargeting, or simply for distributing ATE utilization.

Support multiple ATE platforms

• Advantest: T2000, T33xx, T66xx, T65xx, SZ
• LTX-Credence: Diamond, IMS, Kalos, Quartet/Octet, Schlumberger/NPTest ITS9000, Sapphire
• National Instruments: PXI/PCI-65XX
• Teradyne: J97x, Catalyst, Tiger, J750, Flex, UltraFlex, Nextest
• Verigy: 83000, 9490, V93000 PinScale (AIT and Binary)

Flexible Licensing

TD-Scan's flexible licensing model is designed to meet a variety of customer needs. Terms include montly leasing, worldwide WAN, subscription, and perpetual licensing.

System Requirements

• Windows NT/2000/XP/Vista
• Recommend 8G RAM, 3 GHz CPU speed

Scalability

TD-Scan is part of TSSI pattern conversion product suites: Test Development Series (TDS), TestDeveloper (TD), TD-Sim, and TD-Scan. This scalable suite of products creates test programs from design data using powerful timing extraction and a managed process flow, reducing weeks of troubleshooting, enhancing engineering productivity and increasing first-time design success rates.

TD-Scan, as its name implies, supports primarily scan patterns from ATPG (automatic test pattern generation tools) outputs in the form of WGL (Waveform Generation Language) or STIL (Standard Test Interface Language).

For functional patterns in the form of VCD or EVCD, TD-Scan can be upgraded to TD-Sim or TestDeveloper by a simple license key; thereby, preserving all configuration and processed data.

For more demanding applications, upgrading to, or working in conjunction with the Unix-based TDS package is a popular choice.